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SCANNING PROBE MICROSCOPY FOR INDUSTRIAL APPLICATIONS

NANOMECHANICAL CHARACTERIZATION


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Contributors List xiii Preface xv Acknowledgments xix 1. OVerview of Atomic Force Microscopy 1 Dalia G. YAblon 1.1 A Word on Nomenclature 2 1.2 Atomic Force Microscopy--The Appeal to Industrial R&D 2 1.3 Mechanical Properties 5 1.4 Overview of AFM Operation 6 1.5 Nanomechanical Methods Surveyed in Book 11 1.6 Industries Represented 13 Acknowledgments 14 References 14 2. UNderstanding the Tip-Sample Contact: An Overview of Contact Mechanics from the Macro- to the Nanoscale 15 Tevis D. B. JAcobs, C. MAthew Mate, Kevin T. TUrner, and Robert W. CArpick 2.1 Hertz Equations for Elastic Contact 15 2.2 Adhesive Contacts 22 2.3 Further Extensions of Continuum Contact Mechanics Models 29 2.4 Thin Films 34 2.5 Tangential Forces 37 2.6 Application of Continuum Mechanics to Nanoscale Contacts 42 Acknowledgments 44 Appendix 2A Surface Energy and Work of Adhesion 44 References 45 3. UNderstanding Surface Forces Using Static and Dynamic Approach-Retraction Curves 49 Sudharsan Balasubramaniam, Daniel Kiracofe, and Arvind Raman 3.1 Tip-Sample Interaction Forces 53 3.2 Static F-Z Curves 58 3.3 Dynamic Amplitude/Phase-Distance Curves 69 3.4 Brief Guide to VEDA Simulations 78 3.5 Conclusions 90 Glossary 91 References 93 4. PHase Imaging 95 Dalia G. YAblon and Greg Haugstad 4.1 Introduction 95 4.2 Bistability: Attractive and Repulsive Mode 97 4.3 Complications in Phase Quantification 107 References 113 5. DYnamic Contact AFM Methods for Nanomechanical Properties 115 Donna C. HUrley and Jason P. KIllgore 5.1 Introduction 115 5.2 Force Modulation Microscopy (FMM) 121 5.3 Contact Resonance (CR) Techniques 125 5.4 Comparison of FMM and CR-FM 136 5.5 Other Dynamic Contact Approaches 138 5.6 Summary and Conclusions 140 Acknowledgments 141 Appendix 5A Data Analysis Procedure for Contact Resonance Spectroscopy Measurements 141 References 145 6. GUide to Best Practices for AFM Users 150 Greg Haugstad 6.1 Force-Distance Measurements--Instrumental Sources of Nonideality 151 6.2 Force-Distance Measurements--Physical Sources of Nonideality 157 References 161 7. NAnoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution 162 Steve J. BUll 7.1 Introduction 162 7.2 Bulk Materials 163 7.3 Coatings 176 7.4 Conclusions 188 Acknowledgments 188 References 188 8. SCanning Probe Microscopy for Critical Measurements in the Semiconductor Industry 190 Johann Foucher 8.1 Introduction 190 8.2 Critical Dimension in the Semiconductor Industry 191 8.3 CD Metrology Techniques for Production 192 8.4 Obtaining Accurate CD in the Semiconductor Industry 194 8.5 Hybrid Metrology as a Final Solution to Overcome CD-AFM, CD-SEM, and Scatterometry Intrinsic Limitations 203 8.6 Conclusion 208 References 208 9. ATomic Force Microscopy of Polymers 210 Andy H. TSou and Dalia G. YAblon 9.1 Introduction 210 9.2 Tapping Phase AFM 213 9.3 Nanoindentation 217 9.4 Force Modulation 218 9.5 Pulsed Force Imaging 219 9.6 Force-Volume AFM 220 9.7 HarmoniX and Peak Force QNM Imaging 222 9.8 Summary 227 References 229 10. UNraveling Links between Food Structure and Function with Probe Microscopy 232 A. PAtrick Gunning and Victor J. MOrris 10.1 Introduction 232 10.2 Gels and Thickeners: Molecular Networks 236 10.3 Emulsions and Foams: Protein-Surfactant Competition 238 10.4 Interfacial Structure and Digestion: Designer Interfaces 241 10.5 Force Spectroscopy: Model Emulsions 244 10.6 Force Spectroscopy: Origins of Bioactivity 247 10.7 Conclusions 248 References 249 11. MIcrocantilever Sensors for Petrochemical Applications 251 Alan M. SChilowitz 11.1 Introduction 251 11.2 Background 252 11.3 Applications 257 11.4 Conclusion 266 References 267 12. APplications of Scanni

Detalhes do Produto

    • Ano de Edição: 2013
    • Ano:  2014
    • País de Produção: Germany
    • Código de Barras:  9781118288238
    • ISBN:  1118288238
    • Encadernação:  CAPA DURA
    • Altura: 250.00 cm
    • Largura: 150.00 cm
    • Quantidade de Itens do Complemento:  0
    • Nº de Páginas:  368

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